METAL MICROSCOPE + DEWAR SYSTEM FOR FIELD EMISSION STUDIES

被引:10
作者
SAVAGE, WR
LOW, FJ
机构
关键词
D O I
10.1063/1.1746816
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:848 / &
相关论文
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