CRITICAL-CURRENT DIFFRACTION PATTERNS OF GRAIN-BOUNDARY JOSEPHSON WEAK LINKS

被引:38
作者
PETERSON, RL
EKIN, JW
机构
[1] Electromagnetic Technology Division, National Institute of Standards Technolgy, Boulder
来源
PHYSICAL REVIEW B | 1990年 / 42卷 / 13期
关键词
D O I
10.1103/PhysRevB.42.8014
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We discuss the diffraction patterns and other characteristics of the critical current as a function of magnetic field in grain-boundary Josephson barriers. Diffraction patterns occur not just for SIS junctions but for all types of Josephson links, including SNS junctions, which may be present at grain boundaries in high-Tc superconductors. We discuss the generality of the Airy diffraction pattern, which is expected to characterize grain-boundary barriers in bulk material more accurately than the Fraunhofer pattern. The transport critical-current density in many bulk, granular high-Tc superconductors has a power-law dependence on very low magnetic fields, characteristic of averaged diffraction patterns, and cannot be fitted by an exponential magnetic-field dependence, which may result from the material properties of the barriers. © 1990 The American Physical Society.
引用
收藏
页码:8014 / 8018
页数:5
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