THE EFFECT OF INTEGRATOR LEAK IN SIGMA-DELTA MODULATION

被引：107

作者：

FEELY, O

CHUA, LO

机构：

[1] Department of Electrical Engineering and Computer Sciences, University of California, Berkeley

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1991年 / 38卷 / 11期

关键词：

D O I：

10.1109/31.99158

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Oversampled sigma-delta modulators are finding widespread use in audio and other signal processing applications, due to their simple structure and robustness against circuit imperfections. Exact analyses of the system are complicated by the presence of a discontinuous nonlinear element. The response of most researchers who have studied the system analytically has been to linearize the system and apply standard linear theory, but this approach in general does not yield correct results. In this paper we apply theory from the field of nonlinear dynamics to provide an analytical description of the behavior or the single-loop modulator with leaky integrators. Integrator leak is inevitable in any practical circuit implementation due to finite op-amp gain. The results obtained allow us to discuss in quantitative rather than qualitative terms the robustness of the sigma-delta system to this circuit imperfection.

引用

页码：1293 / 1305

页数：13

共 16 条

[1]

BAILIN H, 1989, ELEMENARY SYMBOLIC D

[2] USE OF LIMIT CYCLE OSCILLATIONS TO OBTAIN ROBUST ANALOG-TO-DIGITAL CONVERTERS [J].