EPITAXIAL THIN-FILMS OF C-70 - GROWTH AND STRUCTURE CHARACTERIZATION

被引：7

作者：

ZHAO, WB ^{[1
]}

ZHANG, XD ^{[1
]}

YE, ZY ^{[1
]}

ZHANG, JL ^{[1
]}

LI, CY ^{[1
]}

YIN, DL ^{[1
]}

GU, ZN ^{[1
]}

ZHOU, XH ^{[1
]}

JIN, ZX ^{[1
]}

机构：

[1] BEIJING UNIV,DEPT CHEM,BEIJING 100871,PEOPLES R CHINA

来源：

SOLID STATE COMMUNICATIONS | 1993年 / 85卷 / 04期

关键词：

D O I：

10.1016/0038-1098(93)90022-F

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Epitaxial thin films of C70 have been grown on (001) mica substrate by resistive evaporation at a vacuum pressure of about 10(-3) Pa.The orientational ordering and the nature of the defects presented in the films were assessed by transmission electron diffraction and electron microscopy. The fundamental structure of the C70 crystals is face-centered cubic with the lattice parameter a0 = 1.50 nm, but forbidden reflections resulted from hcp stacking were also detected which are usually appeared in the prior study of alloys with low stacking fault energy and the solid C60. Furthermore, we also studied the films deposited on (001) NaCl and Si single crystals and the results show these substrates promoted polycrystal growth under the same evaporation conditions where epitaxy was observed on mica.

引用

页码：311 / 315

页数：5

共 12 条

[1]

CHENS D, 1974, PHILOS MAG, V30, P549

[2]

ELANDSSON R, 1988, J CHEM PHYS, V89, P5190

[3] PSEUDOTENFOLD SYMMETRY IN PENTANE-SOLVATED C60 AND C70 [J].

FLEMING, RM ;

KORTAN, AR ;

HESSEN, B ;

SIEGRIST, T ;

THIEL, FA ;

MARSH, P ;

HADDON, RC ;

TYCKO, R ;

DABBAGH, G ;

KAPLAN, ML ;

MUJSCE, AM .

PHYSICAL REVIEW B, 1991, 44 (02) :888-891

[4]

GUO YJ, 1991, NATURE, V351, P464, DOI 10.1038/351464a0

[5] DIRECT MEASUREMENTS OF STACKING-FAULT ENERGIES FROM OBSERVATIONS OF DISLOCATION NODES [J].

HOWIE, A ;

SWANN, PR .

PHILOSOPHICAL MAGAZINE, 1961, 6 (70) :1215-&

[6] ELECTRON-DIFFRACTION AND HIGH-RESOLUTION ELECTRON-MICROSCOPY STUDY ON THE STRUCTURE OF SOLID C-60 [J].

ISHIGURO, T ;

HIROTSU, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (4B) :L481-L483

[7] GROWTH OF LARGE, DEFECT-FREE PURE C-60 SINGLE-CRYSTALS [J].

MENG, RL ;

RAMIREZ, D ;

JIANG, X ;

CHOW, PC ;

DIAZ, C ;

MATSUISHI, K ;

MOSS, SC ;

HOR, PH ;

CHU, CW .

APPLIED PHYSICS LETTERS, 1991, 59 (26) :3402-3403

[8]

SAKURAI M, 1991, JPN J APPL PHYS 2, V30, pL1892

[9]

TAYLOR R, 1990, J CHEM SOC CHEM COMM, V20, P1423

[10] X-RAY-DIFFRACTION AND ELECTRON-SPECTROSCOPY OF EPITAXIAL MOLECULAR C60 FILMS [J].

TONG, WM ;

OHLBERG, DAA ;

YOU, HK ;

WILLIAMS, RS ;

ANZ, SJ ;

ALVAREZ, MM ;

WHETTEN, RL ;

RUBIN, Y ;

DIEDERICH, FN .

JOURNAL OF PHYSICAL CHEMISTRY, 1991, 95 (12) :4709-4712

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