THE APPLICATION OF THE SIMS TECHNIQUE TO QUANTITATIVE CHEMICAL-ANALYSIS

被引：10

作者：

JURELA, Z

机构：

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY | 1981年 / 37卷 / 01期

关键词：

D O I：

10.1016/0020-7381(81)80109-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：67 / 75

页数：9

共 12 条

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ANDERSEN, CA ;

HINTHORNE, JR .

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[2]

Jurela Z., 1973, International Journal of Mass Spectrometry and Ion Physics, V12, P33, DOI 10.1016/0020-7381(73)80084-1

[3]

Jurela Z., 1972, Radiation Effects, V13, P167, DOI 10.1080/00337577208231176

[4]

JURELA Z, 1978, PHYSICS IONIZED GASE, P137

[5]

LOTOTSKII AG, 1976, ZH ANAL KHIM, V31, P433

[6]

LOTOTSKII AG, 1974, INTERACTION ATOMIC 1, P166

[7] QUANTITATIVE SIMS STUDIES WITH A URANIUM MATRIX [J].

MORGAN, AE ;

WERNER, HW .

SURFACE SCIENCE, 1977, 65 (02) :687-699

[8] QUANTITATIVE-ANALYSIS OF LOW-ALLOY STEELS BY SECONDARY ION MASS-SPECTROMETRY [J].

MORGAN, AE ;

WERNER, HW .

ANALYTICAL CHEMISTRY, 1976, 48 (04) :699-708

[9] SECONDARY-ION EMISSION FROM IRON-ALLOYS UNDER VARIOUS BOMBARDING CONDITIONS [J].

SCHROEER, JM .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (01) :343-346

[10] EVALUATION OF LOCAL THERMAL-EQUILIBRIUM MODEL FOR QUANTITATIVE SECONDARY ION MASS-SPECTROMETRIC ANALYSIS [J].

SIMONS, DS ;

BAKER, JE ;

EVANS, CA .

ANALYTICAL CHEMISTRY, 1976, 48 (09) :1341-1348

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