COMPARISON OF THE SIMPLEX-METHOD WITH SEVERAL OTHER METHODS FOR BACKGROUND-FITTING FOR ELECTRON ENERGY-LOSS SPECTRAL QUANTIFICATION OF BIOLOGICAL-MATERIALS

被引：5

作者：

DEBRUIJN, W ^{[1
]}

KETELAARS, D ^{[1
]}

GELSEMA, E ^{[1
]}

SORBER, L ^{[1
]}

机构：

[1] ERASMUS UNIV,FAC MED,DEP MED INFORMAT,3000 DR ROTTERDAM,NETHERLANDS

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1991年 / 2卷 / 2-3期

关键词：

D O I：

10.1051/mmm:0199100202-3028100

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The application of the Simplex optimization procedure allows in functions of the form I(E) = A*E(-r), A and r values to be calculated. The use of element-containing Bio-standards with a known externally determined concentration aids in getting reproducible results. Due to the reproducible spectra, fitting-procedures can be compared. The application of a three-dimensional Simplex optimization allows three parameters mutually to be compared. In this way the minimum length of the fitting zone (GAMMA) can be determined in order to find a constant value of R(x).

引用

页码：281 / 291

页数：11

共 19 条

[1]

BEVINGTON PR, 1969, DATA REDUCTION ERROR, P246

[2] OPTIMIZATION VIA SIMPLEX .1. BACKGROUND, DEFINITIONS AND A SIMPLE APPLICATION [J].

BURTON, KWC ;

NICKLESS, G .

CHEMOMETRICS AND INTELLIGENT LABORATORY SYSTEMS, 1987, 1 (02) :135-149

[3]

CLETON MI, 1986, SCANNING ELECTRON MI, V3, P999

[4]

COLLIEX C, 1986, J ELECTRON MICROSC, V35, P307

[5]

DEBRUIJN WC, 1990, UROL RES, V18, P62

[6]

DEBRUIJN WC, 1985, SCANNING ELECTRON MI, V2, P715

[7]

DEBRUIJN WC, 1985, SCANNING ELECTRON MI, V2, P697

[8]

DEBRUIJN WC, 1981, SCANNING ELECTRON MI, V2, P357

[9]

DEBRUIJN WC, 1990, 12TH P INT C EL MICR, P60

[10]

EGERTON RF, 1986, ENERGY LOSS SPECTROS, P78

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