CONTACT SIZE EFFECTS ON VAN VANDERPAUW METHOD FOR RESISTIVITY AND HALL-COEFFICIENT MEASUREMENT

被引：180

作者：

CHWANG, R

SMITH, BJ

CROWELL, CR

机构：

[1] UNIV SO CALIF,DEPT ELECT ENGN,LOS ANGELES,CA 90007

[2] UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90007

来源：

关键词：

D O I：

10.1016/0038-1101(74)90001-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1217 / 1227

页数：11

共 15 条

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