Z-SCAN TECHNIQUE USING TOP-HAT BEAMS

被引：189

作者：

ZHAO, W ^{[1
]}

PALFFYMUHORAY, P ^{[1
]}

机构：

[1] KENT STATE UNIV,DEPT PHYS,KENT,OH 44242

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 12期

关键词：

D O I：

10.1063/1.110712

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Top-hat instead of Gaussian beams are used in Z-scan experiments to measure nonlinear optical Kerr coefficients of materials. An empirical expression is obtained which allows direct calculation of the Kerr coefficient from measured peak-valley transmittance differences. Predictions of the model are compared with Z-scan measurement on CS2. Using top-hat beams, the sensitivity of Z-scan measurements is a factor of 2.5 greater than for Gaussian beams.

引用

页码：1613 / 1615

页数：3