CHARACTERIZATION OF CRYSTAL DEFECTS IN MIXED TABULAR SILVER-HALIDE GRAINS BY CONVENTIONAL TRANSMISSION ELECTRON-MICROSCOPY AND X-RAY-DIFFRACTOMETRY

被引：41

作者：

GOESSENS, C ^{[1
]}

SCHRYVERS, D ^{[1
]}

VANLANDUYT, J ^{[1
]}

AMELINCKX, S ^{[1
]}

VERBEECK, A ^{[1
]}

DEKEYZER, R ^{[1
]}

机构：

[1] AGFA GEVAERT NV,B-2640 MORTSEL,BELGIUM

来源：

JOURNAL OF CRYSTAL GROWTH | 1991年 / 110卷 / 04期

关键词：

D O I：

10.1016/0022-0248(91)90652-L

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Tabular silver bromide grains with iodide uniformly mixed in the shell were investigated with conventional transmission electron microscopy. The shell region was found to contain a large number of stacking faults parallel with the {111BAR} edges and in some cases edge dislocations with a Burgers vector of 1/2[11BAR0] type. An atomic model for the formation of the stacking faults during the growth is presented.

引用

页码：930 / 941

页数：12

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