MICROWAVE CAVITY FOR HIGH-POWER ENDOR SPECTROSCOPY

被引：4

作者：

CHRISTIDIS, TC ^{[1
]}

HEINEKEN, FW ^{[1
]}

机构：

[1] AMER UNIV, PHYS DEPT, BEIRUT, LEBANON

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1973年 / 6卷 / 05期

关键词：

D O I：

10.1088/0022-3735/6/5/010

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：432 / 434

页数：3

共 9 条

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[2]

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[9] DEFECTS IN IRRADIATED SILICON - ELECTRON PARAMAGNETIC RESONANCE + ELECTRON-NUCLEAR DOUBLE RESONANCE OF SI-E CENTER [J].

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