PAST AND FUTURE SURFACE CRYSTALLOGRAPHY BY LEED

[1] ERROR ANALYSIS AND ADJUSTMENT OF LEED GONIOMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (12) : 1573 - 1579

[2] DIRECT TRANSFORM-DECONVOLUTION METHOD FOR SURFACE-STRUCTURE DETERMINATION [J]. PHYSICAL REVIEW LETTERS, 1974, 33 (10) : 585 - 589

[3] ADAMS DL, 1975, J VAC SCI TECHNOL, V12, P260, DOI 10.1116/1.568731

[4] AUGER SPECTROSCOPY AND LOW-ENERGY ELECTRON-DIFFRACTION STUDIES OF CHEMISORPTION OF UNSATURATED MOLECULES BY (100) SURFACE OF PLATINUM [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1972, 331 (1586): : 321 - 333

[5] LEED GONIOMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (12) : 1569 - 1572

[6] ATOMIC GEOMETRY OF CLEAVAGE SURFACES OF TETRAHEDRALLY COORDINATED COMPOUND SEMICONDUCTORS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04): : 761 - 768

[7] CALCULATIONS OF LOW-ENERGY ELECTRON-DIFFRACTION INTENSITIES FROM POLAR FACES OF ZNO [J]. SURFACE SCIENCE, 1975, 50 (02) : 605 - 614

[8] USE OF A VIDICON CAMERA FOR MEASUREMENT OF LEED BEAM INTENSITIES BY PHOTOGRAPHIC METHOD [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (06): : 1196 - 1198

[9] OXYGEN ADSORPTION ON (110) SILVER [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 383 - 392

[10] FAST LEED-INTENSITY MEASUREMENTS WITH A COMPUTER-CONTROLLED TELEVISION SYSTEM [J]. APPLIED PHYSICS, 1976, 9 (03): : 247 - 251

[1] ERROR ANALYSIS AND ADJUSTMENT OF LEED GONIOMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (12) : 1573 - 1579

[2] DIRECT TRANSFORM-DECONVOLUTION METHOD FOR SURFACE-STRUCTURE DETERMINATION [J]. PHYSICAL REVIEW LETTERS, 1974, 33 (10) : 585 - 589

[3] ADAMS DL, 1975, J VAC SCI TECHNOL, V12, P260, DOI 10.1116/1.568731

[4] AUGER SPECTROSCOPY AND LOW-ENERGY ELECTRON-DIFFRACTION STUDIES OF CHEMISORPTION OF UNSATURATED MOLECULES BY (100) SURFACE OF PLATINUM [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1972, 331 (1586): : 321 - 333

[5] LEED GONIOMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1974, 45 (12) : 1569 - 1572

[6] ATOMIC GEOMETRY OF CLEAVAGE SURFACES OF TETRAHEDRALLY COORDINATED COMPOUND SEMICONDUCTORS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04): : 761 - 768

[7] CALCULATIONS OF LOW-ENERGY ELECTRON-DIFFRACTION INTENSITIES FROM POLAR FACES OF ZNO [J]. SURFACE SCIENCE, 1975, 50 (02) : 605 - 614

[8] USE OF A VIDICON CAMERA FOR MEASUREMENT OF LEED BEAM INTENSITIES BY PHOTOGRAPHIC METHOD [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (06): : 1196 - 1198

[9] OXYGEN ADSORPTION ON (110) SILVER [J]. SURFACE SCIENCE, 1975, 53 (DEC) : 383 - 392

[10] FAST LEED-INTENSITY MEASUREMENTS WITH A COMPUTER-CONTROLLED TELEVISION SYSTEM [J]. APPLIED PHYSICS, 1976, 9 (03): : 247 - 251