X-RAY-SCATTERING DETERMINATION OF THE DYNAMIC STRUCTURE FACTOR OF AL METAL

被引：42

作者：

PLATZMAN, PM

ISAACS, ED

WILLIAMS, H

ZSCHACK, P

ICE, GE

机构：

[1] OAK RIDGE ASSOCIATED UNIV,BROOKHAVEN NATL LAB,UPTON,NY 11973

[2] OAK RIDGE NATL LAB,OAK RIDGE,TN 37831

来源：

PHYSICAL REVIEW B | 1992年 / 46卷 / 20期

关键词：

D O I：

10.1103/PhysRevB.46.12943

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The dynamic structure factor S(q,omega) of conduction electrons in single-crystal Al has been measured using 5.66-keV synchrotron x radiation with 1.5-eV energy resolution. These measurements confirm the existence of strong non-random-phase-approximation-like correlations in an electron liquid where band-structure effects are unimportant.

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页码：12943 / 12946

页数：4

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