ERROR ANALYSIS ON THE PHASE CALCULATION FROM SUPERIMPOSED INTERFEROGRAMS GENERATED BY A WAVELENGTH SCANNING INTERFEROMETER

被引：4

作者：

OKADA, K

SAKUTA, H

OSE, T

TSUJIUCHI, J

机构：

[1] Chiba University, Faculty of Engineering, Department of Image Science and Engineering 1-33 Yayoi cho, Chiba

来源：

OPTICS COMMUNICATIONS | 1990年 / 77卷 / 5-6期

关键词：

D O I：

10.1016/0030-4018(90)90122-A

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An error analysis of wavelength scanning interferometry is shown, in which the interferogram obtained is constructed from more than one interferogram. Computer simulations are carried out to confirm the theoretical considerations in calculating the phase distribution of the individual interferograms. © 1990.

引用

页码：343 / 348

页数：6

共 8 条

[1] EFFECT OF PIEZOELECTRIC TRANSDUCER NONLINEARITY ON PHASE-SHIFT INTERFEROMETRY
AI, C
WYANT, JC
[J]. APPLIED OPTICS, 1987, 26 (06): : 1112 - 1116
[2] HETERODYNE INTERFEROMETRY WITH A FREQUENCY-MODULATED LASER DIODE
CHEN, J
ISHII, Y
MURATA, K
[J]. APPLIED OPTICS, 1988, 27 (01) : 124 - 128
[3] PHASE-SHIFTER CALIBRATION IN PHASE-SHIFTING INTERFEROMETRY
CHENG, YY
WYANT, JC
[J]. APPLIED OPTICS, 1985, 24 (18): : 3049 - 3052
[4] DIGITAL PHASE-MEASURING INTERFEROMETRY WITH A TUNABLE LASER DIODE
ISHII, Y
CHEN, J
MURATA, K
[J]. OPTICS LETTERS, 1987, 12 (04) : 233 - 235
[5] OKADA K, 1990, IN PRESS APPL OPTICS, V29
[6] DIGITAL WAVE-FRONT MEASURING INTERFEROMETRY - SOME SYSTEMATIC-ERROR SOURCES
SCHWIDER, J
BUROW, R
ELSSNER, KE
GRZANNA, J
SPOLACZYK, R
MERKEL, K
[J]. APPLIED OPTICS, 1983, 22 (21) : 3421 - 3432
[7] DIODE-LASER DIRECT MODULATION HETERODYNE INTERFEROMETER
TATSUNO, K
TSUNODA, Y
[J]. APPLIED OPTICS, 1987, 26 (01) : 37 - 40
[8] TUNABLE DIODE-LASER CONTROL BY A STEPPING MICHELSON INTERFEROMETER
VALENTIN, A
NICOLAS, C
HENRY, L
MANTZ, AW
[J]. APPLIED OPTICS, 1987, 26 (01): : 41 - 46

← 1 →