SIZE EFFECTS IN RESIDUAL RESISTANCE RATIOS FOR ZINC WHISKERS - (RHO300 DEGREES K/RHO4.2 DEGREES K-1000 - E)

被引：11

作者：

SKOVE, MJ

STILLWELL, EP

机构：

来源：

APPLIED PHYSICS LETTERS | 1965年 / 7卷 / 09期

关键词：

D O I：

10.1063/1.1754397

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：241 / +

页数：1

共 15 条

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[9] ACOUSTIC MEASUREMENTS OF ELECTRONIC STRUCTURE OF ZINC AND CADMIUM [J].

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[10] ELECTRICAL RESISTIVITY OF THIN EPITAXIALLY GROWN SILVER FILMS ( RESISTIVITY RATIOS 17 TO 175 WITH FILM THICKNESS 640 TO 13000 A E/T ) [J].

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