TOWNSEND IONIZATION COEFFICIENTS IN COMPRESSED NITROGEN

[1] ALLEN NL, 1956, MIT107 LAB INS RES T

[2] ELECTRICAL BREAKDOWN OF GASES .2. SPARK MECHANISM IN NITROGEN [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1952, 213 (1113): : 203 - 214

[3] Thin film field emission [J]. PHYSICAL REVIEW, 1936, 50 (01): : 48 - 58

[4] MASCH K, 1932, ARCH ELEKTROTECH, V26, P589

[5] The Townsend coefficients and spark discharge [J]. PHYSICAL REVIEW, 1936, 50 (07): : 650 - 658

[6] A feedback micromicroammeter [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1939, 10 (06) : 181 - 183

[7] INVESTIGATION OF BACK DIFFUSION OF PHOTOELECTRONS IN VARIOUS STANDARD GASES AS IT AFFECTS SECONDARY ELECTRON EMISSION COEFFICIENTS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (02) : 123 - 127

[8] ELECTRIC BREAKDOWN IN CO2 FROM LOW PRESSURES TO THE LIQUID STATE [J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (03) : 222 - 231

[1] ALLEN NL, 1956, MIT107 LAB INS RES T

[2] ELECTRICAL BREAKDOWN OF GASES .2. SPARK MECHANISM IN NITROGEN [J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1952, 213 (1113): : 203 - 214

[3] Thin film field emission [J]. PHYSICAL REVIEW, 1936, 50 (01): : 48 - 58

[4] MASCH K, 1932, ARCH ELEKTROTECH, V26, P589

[5] The Townsend coefficients and spark discharge [J]. PHYSICAL REVIEW, 1936, 50 (07): : 650 - 658

[6] A feedback micromicroammeter [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1939, 10 (06) : 181 - 183

[7] INVESTIGATION OF BACK DIFFUSION OF PHOTOELECTRONS IN VARIOUS STANDARD GASES AS IT AFFECTS SECONDARY ELECTRON EMISSION COEFFICIENTS [J]. JOURNAL OF APPLIED PHYSICS, 1953, 24 (02) : 123 - 127

[8] ELECTRIC BREAKDOWN IN CO2 FROM LOW PRESSURES TO THE LIQUID STATE [J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (03) : 222 - 231