PREPARATION OF STM TIPS FOR INSITU CHARACTERIZATION OF ELECTRODE SURFACES

被引：53

作者：

HEBEN, MJ

DOVEK, MM

LEWIS, NS

PENNER, RM

QUATE, CF

机构：

[1] CALTECH, DIV CHEM & CHEM ENGN, PASADENA, CA 91125 USA

[2] STANFORD UNIV, DEPT APPL PHYS, STANFORD, CA 94305 USA

来源：

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01434.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：651 / 661

页数：11

共 29 条

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