IMAGE-RESOLUTION OF SCANNING ACOUSTIC MICROSCOPE

[1] THE SPECIFICATION OF IMAGING PROPERTIES BY RESPONSE TO A SINE WAVE INPUT [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1954, 44 (06) : 468 - 471

[2] KOMPFNER R, COMMUNICATION

[3] INTEGRATED-CIRCUITS AS VIEWED WITH AN ACOUSTIC MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1974, 25 (05) : 251 - 253

[4] LEMONS RA, 1975, THESIS STANFORD U

[5] LEMONS RA, RPT7525, P562

[6] PAPOULIS A, 1968, SYSTEMS TRANSFORMS A, pCH11

[7] QUATE CF, 1976, IEEE S MTT INT MICRO

[8] ACOUSTIC PROPERTIES OF SPUTTERED GLASS AT MICROWAVE-FREQUENCIES [J]. APPLIED PHYSICS LETTERS, 1976, 29 (05) : 277 - 279

[9] PHASE IMAGING WITH SCANNING ACOUSTIC MICROSCOPE [J]. ELECTRONICS LETTERS, 1976, 12 (24) : 637 - 638

[1] THE SPECIFICATION OF IMAGING PROPERTIES BY RESPONSE TO A SINE WAVE INPUT [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1954, 44 (06) : 468 - 471

[2] KOMPFNER R, COMMUNICATION

[3] INTEGRATED-CIRCUITS AS VIEWED WITH AN ACOUSTIC MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1974, 25 (05) : 251 - 253

[4] LEMONS RA, 1975, THESIS STANFORD U

[5] LEMONS RA, RPT7525, P562

[6] PAPOULIS A, 1968, SYSTEMS TRANSFORMS A, pCH11

[7] QUATE CF, 1976, IEEE S MTT INT MICRO

[8] ACOUSTIC PROPERTIES OF SPUTTERED GLASS AT MICROWAVE-FREQUENCIES [J]. APPLIED PHYSICS LETTERS, 1976, 29 (05) : 277 - 279

[9] PHASE IMAGING WITH SCANNING ACOUSTIC MICROSCOPE [J]. ELECTRONICS LETTERS, 1976, 12 (24) : 637 - 638