THICKNESS PERIODICITY IN THE AUGER LINE-SHAPE FROM EPITAXIAL (111)CU FILMS

被引：24

作者：

NAMBA, Y

VOOK, RW

CHAO, SS

机构：

来源：

SURFACE SCIENCE | 1981年 / 109卷 / 02期

关键词：

D O I：

10.1016/0039-6028(81)90490-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：320 / 330

页数：11

相关论文

共 11 条

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