PARTICLE DAMAGE EFFECTS IN GAAS JFET TEST STRUCTURES

[1] BOHR N, 1948, KGL DANSKE VIDEN MFM, V18

[2] RADIATION-DAMAGE EFFECTS OF ELECTRONS AND H, HE, O, CL AND CU IONS ON GAAS JFETS [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) : 4388 - 4392

[3] SLATER M, 1984, RAD EFFECTS, V83, P226

[4] Ziegler J.F., 1984, STOPPING RANGE IONS

[5] RADIATION EFFECTS IN GAAS JUNCTION FIELD-EFFECT TRANSISTORS [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (05) : 1343 - 1354

[1] BOHR N, 1948, KGL DANSKE VIDEN MFM, V18

[2] RADIATION-DAMAGE EFFECTS OF ELECTRONS AND H, HE, O, CL AND CU IONS ON GAAS JFETS [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) : 4388 - 4392

[3] SLATER M, 1984, RAD EFFECTS, V83, P226

[4] Ziegler J.F., 1984, STOPPING RANGE IONS

[5] RADIATION EFFECTS IN GAAS JUNCTION FIELD-EFFECT TRANSISTORS [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (05) : 1343 - 1354