Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns

被引：592

作者：

Hanawalt, JD ^{[1
]}

Rinn, HW ^{[1
]}

Frevel, LK ^{[1
]}

机构：

[1] Dow Chem Co, Midland, MI USA

来源：

INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION | 1938年 / 10卷

关键词：

D O I：

10.1021/ac50125a001

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：0457 / 0512

页数：56

共 10 条

[1] *AM SOC TEST MAT S, 1937, AM SOC TEST MAT S RA
[2] CLARK GL, 1932, APPL X RAYS
[3] DAVEY WP, 1922, GEN ELECTR REV, V25, P565
[4] Ewald P.P., 1931, AKAD VERLAGSGESELLSC
[5] GLOCKER R, 1936, MATERIALPRUFUNG MIT
[6] HALLA F, 1937, RONTGENOGRAPHISCHE U
[7] Identification of crystalline materials - Classification and use of x-ray diffraction patterns
Hanawalt, JD
Rinn, HW
[J]. INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1936, 8 : 244 - 247
[8] A new method of chemical analysis
Hull, AW
[J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1919, 41 : 1168 - 1175
[9] Wyckoff R. W. G., 1930, STRUCTURE CRYSTALS, V2nd
[10] [No title captured]