PHOTOPYROELECTRIC SPECTROSCOPY OF ALPHA-SI-H THIN SEMICONDUCTING-FILMS ON QUARTZ

被引：33

作者：

MANDELIS, A

WAGNER, RE

GHANDI, K

BALTMAN, R

DAO, P

机构：

[1] UNIV TORONTO,ONTARIO LASER & LIGHTWAVE RES CTR,TORONTO M5S 1A4,ONTARIO,CANADA

[2] EASTMAN KODAK CO,RES LABS,CORP ANALYT LAB,ROCHESTER,NY 14650

来源：

PHYSICAL REVIEW B | 1989年 / 39卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.39.5254

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：5254 / 5260

页数：7

相关论文

共 32 条

[1] PHOTOTHERMAL MEASUREMENTS USING A LOCALIZED EXCITATION SOURCE
AAMODT, LC
MURPHY, JC
[J]. JOURNAL OF APPLIED PHYSICS, 1981, 52 (08) : 4903 - 4914
[2] ABELES F, 1967, ADV OPTICAL TECHNIQU, pCH5
[3] AMER NM, 1984, SEMICONDUCTORS SEM B, V21, pCH3
[4] PROPERTIES OF AMORPHOUS SILICON FILMS - DEPENDENCE ON DEPOSITION CONDITIONS
BAHL, SK
BHAGAT, SM
[J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1975, 17 (03) : 409 - 427
[5] BENTO AC, 1987, PHYS CHEM GLASSES, V28, P127
[6] STRUCTURAL, OPTICAL, AND ELECTRICAL PROPERTIES OF AMORPHOUS SILICON FILMS
BRODSKY, MH
TITLE, RS
WEISER, K
PETTIT, GD
[J]. PHYSICAL REVIEW B, 1970, 1 (06): : 2632 - &
[7] Cody G. D., 1984, SEMICONDUCTORS SEM B, p21B
[8] PHOTOTHERMAL SPECTROSCOPY OF WEAKLY ABSORBING SAMPLES USING A THERMAL WAVE PHASE-SHIFTER
COUFAL, H
[J]. APPLIED PHYSICS LETTERS, 1984, 45 (05) : 516 - 518
[9] PYROELECTRIC CALORIMETER FOR PHOTOTHERMAL STUDIES OF THIN-FILMS AND ADSORBATES
COUFAL, HJ
GRYGIER, RK
HORNE, DE
FROMM, JE
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (05): : 2875 - 2889
[10] DETERMINATION OF OPTICAL-CONSTANTS OF THIN-FILMS FROM MEASUREMENTS OF REFLECTANCE AND TRANSMITTANCE AT NORMAL INCIDENCE
DENTON, RE
TOMLIN, SG
CAMPBELL, RD
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1972, 5 (04) : 852 - &

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