TOPOGRAFINER - INSTRUMENT FOR MEASURING SURFACE MICROTOPOGRAPHY

[1] RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) : 123 - +

[2] UNCERTAINTIES IN OPTICAL CONSTANTS DETERMINED FROM ISOREFLECTANCE CURVES [J]. APPLIED OPTICS, 1966, 5 (04) : 565 - +

[3] GOOD RH, 1956, HDB PHYSIK, V21

[4] ERRORS IN USING REFLECTANCE VS ANGLE OF INCIDENCE METHOD FOR MEASURING OPTICAL CONSTANTS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (10P1) : 1197 - &

[5] MOLECULAR VIBRATION SPECTRA BY INELASTIC ELECTRON TUNNELING [J]. PHYSICAL REVIEW, 1968, 165 (03): : 821 - &

[6] JOSEPHSON-TYPE SUPERCONDUCTING TUNNEL JUNCTIONS AS GENERATORS OF MICROWAVE AND SUBMILLIMETER WAVE RADIATION [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (04): : 560 - +

[7] Loewen E. G., 1970, Journal of Physics E (Scientific Instruments), V3, P953, DOI 10.1088/0022-3735/3/12/201

[8] OSTERKAMP WJ, 1948, PHILIPS RES REP, V3, P58

[9] FIELD-EMISSION STUDIES OF ELECTRONIC ENERGY LEVELS OF ADSORBED ATOMS [J]. PHYSICAL REVIEW B-SOLID STATE, 1970, 1 (05): : 2088 - +

[10] ELECTRON TRAJECTORIES IN A FIELD EMISSION MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (03) : 970 - &

[1] RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) : 123 - +

[2] UNCERTAINTIES IN OPTICAL CONSTANTS DETERMINED FROM ISOREFLECTANCE CURVES [J]. APPLIED OPTICS, 1966, 5 (04) : 565 - +

[3] GOOD RH, 1956, HDB PHYSIK, V21

[4] ERRORS IN USING REFLECTANCE VS ANGLE OF INCIDENCE METHOD FOR MEASURING OPTICAL CONSTANTS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1965, 55 (10P1) : 1197 - &

[5] MOLECULAR VIBRATION SPECTRA BY INELASTIC ELECTRON TUNNELING [J]. PHYSICAL REVIEW, 1968, 165 (03): : 821 - &

[6] JOSEPHSON-TYPE SUPERCONDUCTING TUNNEL JUNCTIONS AS GENERATORS OF MICROWAVE AND SUBMILLIMETER WAVE RADIATION [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (04): : 560 - +

[7] Loewen E. G., 1970, Journal of Physics E (Scientific Instruments), V3, P953, DOI 10.1088/0022-3735/3/12/201

[8] OSTERKAMP WJ, 1948, PHILIPS RES REP, V3, P58

[9] FIELD-EMISSION STUDIES OF ELECTRONIC ENERGY LEVELS OF ADSORBED ATOMS [J]. PHYSICAL REVIEW B-SOLID STATE, 1970, 1 (05): : 2088 - +

[10] ELECTRON TRAJECTORIES IN A FIELD EMISSION MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1962, 33 (03) : 970 - &