GRAIN SIZE DEPENDENCE OF CRITICAL CURRENT DENSITIES IN HOT ISOSTATICALLY PRESSED SnMo6S8

被引:12
作者
Bonney, L. A. [1 ]
Willis, T. C. [2 ]
Larbalestier, D. C. [2 ]
机构
[1] Univ Wisconsin, Mat Sci Program, 1500 Johnson Dr, Madison, WI 53706 USA
[2] Univ Wisconsin, Mat Sci & Engn Dept, Madison, WI 53706 USA
关键词
D O I
10.1109/77.233361
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The dependence of critical current density on the heat treatment and microstructure of SnMo6S8 was systematically studied. Powders with minimal initial oxygen contamination were processed by hot isostatic pressing at 800 degrees C to produce a sample having a mid-point inductive critical temperature of 14.2 K, a magnetization critical current density of 820 A/mm(2) (9 T, 4.2 K) and electromagnetically non-granular behavior. The microstructure was controlled by varying subsequent heat treatment temperature and time and was examined by scanning and transmission electron microscopies. In each sample grains appeared well-connected and ranged over two orders of magnitude in size, with average grain sizes being between 0.2 and 0.5 mu m. Critical current density decreased with increasing annealing temperature and time and at fields <8 T was inversely proportional to the grain size. These results show that Chevrel phase materials are not intrinsically weakly coupled and that grain boundaries are sites of Abrikosov vortex pinning.
引用
收藏
页码:1582 / 1585
页数:4
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