OPTIMUM SI-SI1-XGEX STRUCTURES WITH STRONG INFRARED-SPECTRA

被引：12

作者：

TURTON, RJ

JAROS, M

机构：

[1] Department of Physics, The University, Newcastle Upon Tyne

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 08期

关键词：

D O I：

10.1063/1.102708

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have identified symmetrically strained Si-Si1-xGex superlattices with optimum strength infrared spectra in the range 50-300 meV. The growth structure parameters required for implementing such systems are provided.

引用

页码：767 / 769

页数：3

共 6 条

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