DIELECTRIC RELAXATIONS IN CERAMICS WITH COMPOSITIONS (1-X)PB(MG1/3NB2/3)O-3-XPBTIO(3) (X=0, 0.05, 0.10 AND 0.25)

被引：11

作者：

ELISSALDE, C ^{[1
]}

RAVEZ, J ^{[1
]}

GAUCHER, P ^{[1
]}

机构：

[1] THOMSON CSF,CENT RECH LAB,F-91401 ORSAY,FRANCE

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1994年 / 22卷 / 2-3期

关键词：

D O I：

10.1016/0921-5107(94)90261-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Dielectric measurements have been performed on ceramics with composition (1 - x)PMN - x(PbTiO3,) (x = 0, 0.05, 0.10, 0.25), in the frequency and temperature ranges 10(2)-10(9) Hz and 200-450 K respectively. Compared with PMN, the addition of PbTiO3 leads to higher values of both epsilon(r)(') and T-m, the temperature of the maximum of epsilon(r)(')at low frequency. In addition the transition becomes less diffuse when x increases. Moreover, two different relaxations at high and low frequencies are observed for x=0,0.05 and 0.10. The two relaxation frequencies depend strongly on both temperature and composition. The low frequency relaxation disappears for x=0.25. Correlations between nanostructure evolution and dielectric properties are discussed.

引用

页码：303 / 309

页数：7