TRAPPING LEVELS IN DIFFERENT CRYSTALLINE PHTHALOCYANINES

被引:13
作者
DEVAUX, P
MAS, J
机构
[1] Groupe de Physique des Solides de l'ENS Laboratoire associé au CNRS. Tour 23, 9, quai St-Bernard
关键词
D O I
10.1016/0038-1098(69)90492-X
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A high density of trapping levels is found at a depth of 0.37 eV in CuPc, H2Pc and NiPc. A shallower (≈ 0.3 eV) trap is found in ZnPc. The recombination proceeds bimolecularly on centres filled during the generation process. Room temperature dark conductivity is extrinsic. © 1969.
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页码:1095 / &
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