THE RECORDING AND ANALYSIS OF SYNCHROTRON X-RADIATION LAUE DIFFRACTION PHOTOGRAPHS

被引：234

作者：

HELLIWELL, JR

HABASH, J

CRUICKSHANK, DWJ

HARDING, MM

GREENHOUGH, TJ

CAMPBELL, JW

CLIFTON, IJ

ELDER, M

MACHIN, PA

PAPIZ, MZ

ZUREK, S

机构：

[1] UNIV YORK,DEPT PHYS,YORK YO1 5DD,N YORKSHIRE,ENGLAND

[2] UNIV LIVERPOOL,DEPT CHEM,LIVERPOOL L69 3BX,ENGLAND

[3] UNIV KEELE,DEPT PHYS,KEELE ST5 5BG,STAFFS,ENGLAND

[4] SERC,DARESBURY LAB,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND

[5] UNIV MANCHESTER,INST SCI & TECHNOL,DEPT CHEM,MANCHESTER M60 1QD,LANCS,ENGLAND

来源：

关键词：

D O I：

10.1107/S0021889889006564

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：483 / 497

页数：15

共 53 条

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