2-BEAM FEATURES IN ELECTRON-DIFFRACTION PATTERNS - APPLICATION TO REFINEMENT OF LOW-ORDER STRUCTURE FACTORS IN GAAS

被引：14

作者：

GJONNES, K ^{[1
]}

GJONNES, J ^{[1
]}

ZUO, J ^{[1
]}

SPENCE, JCH ^{[1
]}

机构：

[1] ARIZONA STATE UNIV, DEPT PHYS, TEMPE, AZ 85287 USA

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1988年 / 44卷

关键词：

D O I：

10.1107/S0108767388004362

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：810 / 820

页数：11

共 31 条

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