TOLERANCES FOR LAYER THICKNESSES IN DIELECTRIC MULTILAYER COATINGS AND INTERFERENCE FILTERS

被引：6

作者：

MIELENZ, KD

机构：

来源：

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY | 1960年 / 64卷 / 06期

关键词：

D O I：

10.6028/jres.064A.047

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：487 / 495

页数：9

共 10 条

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[2]

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[3]

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[4] ALL-DIELECTRIC HIGH-REFLECTING LAYERS [J].

HEAVENS, OS .

KOEHLER, WF .

[6] PHASE SHIFT EFFECTS IN FABRY-PEROT INTERFEROMETRY [J].

KOESTER, CJ .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1960, 64 (03) :191-200

[7]

LINBERG VL, 1955, J OPT SOC AM, V45, P328

[8] USE OF CHEBYCHEV POLYNOMIALS IN THIN FILM COMPUTATIONS [J].

MIELENZ, KD .

JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1959, 63 (03) :297-300

STEUDEL, A .

[10]

TRAUB AC, 1956, J OPT SOC AM, V46, P999