DETERMINATION OF DEFOCUS VALUES USING FOURIER IMAGES FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：13

作者：

IIJIMA, S

OKEEFE, MA

机构：

[1] Center for Solid State Science, Arizona State University, Tempe, Arizona

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1979年 / 117卷 / DEC期

关键词：

D O I：

10.1111/j.1365-2818.1979.tb04691.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The phenomenon of Fourier images is used to calibrate defocus steps of a high resolution transmission electron microscope. Results compare well with measurements from an optical diffractogram. 1979 Blackwell Science Ltd

引用

页码：347 / 354

页数：8

共 7 条

[1] FOURIER IMAGES .1. THE POINT SOURCE
COWLEY, JM
MOODIE, AF
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1957, 70 (05): : 486 - +
[2] IIJIMA S, 1979, 37TH ANN P EMSA
[3] KRIVANEK OL, 1976, OPTIK, V45, P97
[4] COMPUTED CRYSTAL-STRUCTURE IMAGES FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY
OKEEFE, MA
BUSECK, PR
IIJIMA, S
[J]. NATURE, 1978, 274 (5669) : 322 - 324
[5] OKEEFE MA, 1978, 9TH P INT C EL MICR, V1, P282
[6] REFINEMENT OF DEFECT STRUCTURE OF GENB9O25 BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
SKARNULIS, AJ
IIJIMA, S
COWLEY, JM
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1976, 32 (SEP1): : 799 - &
[7] SPENCE JCH, 1977, OPTIK, V49, P307

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