OBJECT SHAPE, FRINGE VISIBILITY, AND RESOLUTION IN FAR-FIELD HOLOGRAPHY

[1] PARTICLE SIZING USING FAR-FIELD HOLOGRAPHY - NEW DEVELOPMENTS [J]. OPTICAL ENGINEERING, 1980, 19 (05) : 727 - 733

[2] DOTSON WP, 1972, SPIE, P113

[3] DUNN P, 1979, J OPT SOC AM, V69, P1402

[4] Murata K., 1970, P C ENG US HOL, P289

[5] ON FRAUNHOFER ( FAR FIELD ) DIFFRACTION PATTERNS OF OPAQUE + TRANSPARENT OBJECTS WITH COHERENT BACKGROUND [J]. OPTICA ACTA, 1964, 11 (03): : 183 - +

[6] A CALCULATION OF EDGE SMEAR IN FAR-FIELD HOLOGRAPH USING A SHORT-CUT EDGE TRACE TECHNIQUE [J]. APPLIED OPTICS, 1970, 9 (02): : 496 - &

[7] Silverman BA, 1964, J APPL METEOR, V3, P792

[8] Thompson B. J., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V215, P102

[9] Thompson B. J., 1966, J APPL METEOROL, V5, P343, DOI 10.1175/1520-0450(1966)0050343:ARTFTL2.0.CO

[10] 2

[1] PARTICLE SIZING USING FAR-FIELD HOLOGRAPHY - NEW DEVELOPMENTS [J]. OPTICAL ENGINEERING, 1980, 19 (05) : 727 - 733

[2] DOTSON WP, 1972, SPIE, P113

[3] DUNN P, 1979, J OPT SOC AM, V69, P1402

[4] Murata K., 1970, P C ENG US HOL, P289

[5] ON FRAUNHOFER ( FAR FIELD ) DIFFRACTION PATTERNS OF OPAQUE + TRANSPARENT OBJECTS WITH COHERENT BACKGROUND [J]. OPTICA ACTA, 1964, 11 (03): : 183 - +

[6] A CALCULATION OF EDGE SMEAR IN FAR-FIELD HOLOGRAPH USING A SHORT-CUT EDGE TRACE TECHNIQUE [J]. APPLIED OPTICS, 1970, 9 (02): : 496 - &

[7] Silverman BA, 1964, J APPL METEOR, V3, P792

[8] Thompson B. J., 1980, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V215, P102

[9] Thompson B. J., 1966, J APPL METEOROL, V5, P343, DOI 10.1175/1520-0450(1966)0050343:ARTFTL2.0.CO

[10] 2