HARDNESS ASSURANCE CONSIDERATIONS FOR LONG-TERM IONIZING-RADIATION EFFECTS ON BIPOLAR STRUCTURES

被引：36

作者：

HART, AR ^{[1
]}

SMYTH, JB ^{[1
]}

VANLINT, VAJ ^{[1
]}

SNOWDEN, DP ^{[1
]}

LEADON, RE ^{[1
]}

机构：

[1] IRT CORP, SAN DIEGO, CA USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1978年 / 25卷 / 06期

关键词：

D O I：

10.1109/TNS.1978.4329561

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1502 / 1507

页数：6

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