DEVELOPMENT OF A SYSTEM FOR TRACE-ELEMENT ANALYSIS IN ENVIRONMENT BY CHARGED-PARTICLE X-RAY-FLUORESCENCE

被引：30

作者：

GORDON, BM

KRANER, HW

机构：

[1] BROOKHAVEN NATL LAB,DEPT APPL SCI,UPTON,NY 11973

[2] BROOKHAVEN NATL LAB,DEPT INSTR & HLTH PHYS,UPTON,NY 11973

来源：

JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1972年 / 12卷 / 01期

关键词：

D O I：

10.1007/BF02520987

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：181 / 188

页数：8

共 11 条

[1] BOWMAN HR, UCRL16580, P95
[2] CAHILL TA, 1971, B AM PHYS SOC, V16, P545
[3] ATOMIC FLUORESCENCE YIELDS
FINK, RW
JOPSON, RC
MARK, H
SWIFT, CD
[J]. REVIEWS OF MODERN PHYSICS, 1966, 38 (03) : 513 - &
[4] GORDON BM, 1971, 5 P ANN C TRAC SUBST
[5] X-RAY ANALYSIS - ELEMENTAL TRACE ANALYSIS AT 10-12G LEVEL
JOHANSSON, TB
AKSELSSON, R
JOHANSSON, SA
[J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 84 (01): : 141 - +
[6] KHANDELWAL GS, 1969, ATOM DATA, V1, P103
[7] KRANER HW, UNPUBLISHED DATA
[8] KRAUSHAAR JJ, 1971, B AM PHYS SOC, V16, P545
[9] LEROUX J, 1962, ADVANCES XRAY ANAL, V5, P153
[10] Merzbacher E., 1958, ENCYCL PHYS, V6, P166