STRESS MEASUREMENT OF TRANSPARENT MATERIALS BY POLARIZED LASER

被引:8
作者
NIITSU, Y [1 ]
ICHINOSE, K [1 ]
IKEGAMI, K [1 ]
机构
[1] TOKYO INST TECHNOL,PRECIS & INTELLIGENCE LAB,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN
来源
JSME INTERNATIONAL JOURNAL SERIES A-MECHANICS AND MATERIAL ENGINEERING | 1995年 / 38卷 / 01期
关键词
RESIDUAL STRESS; EXPERIMENTAL STRESS ANALYSIS; HIGH POLYMER MATERIALS; MATERIAL TESTING; PHOTOELASTIC MODULATOR; ADHESIVE LAYER;
D O I
10.1299/jsmea1993.38.1_68
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Optical birefringence is measured by a high-frequency modulation method using a photoelastic modulator and a polarized laser. This measurement has the high sensitivity required to measure very small birefringence produced by stress. By this measuring method, the magnitudes of the differences in principal stresses and their directions are obtained directly and quantitatively. The photoelastic properties of glass, polymethyl methacrylate (PMMA) and two kinds of epoxy resins are measured with the equipment. The distributions of optical birefringence corresponding to stress distributions are measured for glass plates bonded with epoxy resin. The residual stress caused by the bonding process is measured. This stress measuring method is applicable to detection of the stress distribution of transparent solid materials.
引用
收藏
页码:68 / 72
页数:5
相关论文
共 7 条
[1]  
ICHINOSE K, 1992, T JPN SOC MECH, V58, P1900
[2]   AN IMPROVED METHOD FOR HIGH REFLECTIVITY ELLIPSOMETRY BASED ON A NEW POLARIZATION MODULATION TECHNIQUE [J].
JASPERSON, SN ;
SCHNATTERLY, SE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :761-+
[4]   HIGH-FREQUENCY POLARIZATION MODULATION METHOD FOR MEASURING BIREFRINGENCE [J].
MODINE, FA ;
MAJOR, RW ;
SONDER, E .
APPLIED OPTICS, 1975, 14 (03) :757-760
[5]  
MODINE FA, 1975, J APPLIED OPTICS, V14, P761
[6]  
NIITSU Y, 1993, T JPN SOC MECH ENG, V59, P600
[7]  
NIITSU Y, 1992, P ASME JSME JOINT C, V2, P1005