INTERFACIAL BONDING IN W/C AND W/B4C MULTILAYERS

被引:24
作者
JANKOWSKI, AF
SCHRAWYER, LR
WALL, MA
CRAIG, WW
MORALES, RI
MAKOWIECKI, DM
机构
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1989年 / 7卷 / 04期
关键词
D O I
10.1116/1.576169
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:2914 / 2918
页数:5
相关论文
共 12 条
[1]  
CHASE M, 1985, JANAF THERMOCHEMIC 1, P541
[2]  
CRAIG WW, 1988, SPIE, V982, P362
[3]  
DAVIS LE, 1976, HDB AUGER ELECTRON S
[4]  
Hultgren RR, 1973, SELECTED VALUES THER
[5]  
JANKOWSKI AF, 1988, SPIE, V984, P64
[6]  
KUBASCHEWSKI O, 1979, METALLURGICAL THERMO, P270
[7]   INFLUENCE OF THE DEPTH RESOLUTION ON THE RESULTING AES PROFILES OF COMPONENTS IN MULTILAYER THIN-FILM STRUCTURES [J].
PETRAKIAN, JP ;
RENUCCI, P .
SURFACE SCIENCE, 1988, 195 (1-2) :151-160
[8]  
RDY E, 1967, PLANSEEBER PULVERMET, V15, P174
[9]   PHASE EQUILIBRIA IN SYSTEM TUNGSTEN-CARBON [J].
SARA, RV .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1965, 48 (05) :251-&
[10]  
Seah M. P., 1979, Surface and Interface Analysis, V1, P2, DOI 10.1002/sia.740010103