SOME PHYSICAL-PROPERTIES OF EVAPORATED THIN-FILMS OF ANTIMONY TRISULFIDE

被引：30

作者：

ELMANDOUH, ZS ^{[1
]}

SALAMA, SN ^{[1
]}

机构：

[1] NATL RES CTR,GLASS RES DEPT,CAIRO,EGYPT

来源：

JOURNAL OF MATERIALS SCIENCE | 1990年 / 25卷 / 03期

关键词：

D O I：

10.1007/BF01045375

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The optical properties of thin films of red Sb2S3 prepared by vacuum evaporation on amorphous substrates were determined from transmission measurements. The variation of the extinction coefficient, K, shows structures at energies of 4.4 and 5.4 eV. The band gap was found to be 1.7 eV for film of thickness 56 nm, and increase with thickness. The interpretation of structure was inferred from transmission electron microscopy and X-ray diffraction for thin films of antimony trisulphide. The investigated film thicknesses were from 46 to 64 nm. © 1990 Chapman and Hall Ltd.

引用

页码：1715 / 1718

页数：4

共 18 条

[1]

CHOPRA KL, 1969, THIN FILM PHENOMENA, P172

[2]

Cullity BD., 1978, ELEMENTS XRAY DIFFRA, P107

[3]

DAVIES EA, 1973, 13TH 13TH P SESS SCO, P425

[4] INTERBAND SPECTRA OF AS2S3 AND AS2SE3 CRYSTALS AND GLASSES [J].