EVALUATION OF AN ORIFICE PROBE FOR PLASMA DIAGNOSTICS

被引：27

作者：

PROKOPEN.SM ^{[1
]}

LAFRAMBO.JG ^{[1
]}

GOODINGS, JM ^{[1
]}

机构：

[1] YORK UNIV,CTR RES EXPTL SPACE SCI,TORONTO,ONTARIO,CANADA

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1972年 / 5卷 / 12期

关键词：

D O I：

10.1088/0022-3727/5/12/304

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2152 / 2160

页数：9

共 17 条

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[10] EVALUATION AND DEMONSTRATION OF USE OF RETARDING POTENTIAL ANALYZERS FOR MEASURING SEVERAL IONOSPHERIC QUANTITIES [J].

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