HIGH-PRECISION AC-DC TRANSFER STANDARDS AT ETL

被引:17
作者
SASAKI, H
TAKAHASHI, K
KLONZ, M
ENDO, T
机构
[1] JAPAN ELECT METERS INSPECT CORP,MINATO KU,TOKYO 108,JAPAN
[2] PHYS TECH BUNDESANSTALT,W-3300 BRAUNSCHWEIG,GERMANY
关键词
D O I
10.1109/19.278635
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new measurement system has been developed in order to re-evaluate the present ac-dc transfer standards of the Electrotechnical Laboratory (ETL). The new measurement system consists of a high-precision comparator system and a modified fast-reversed dc source. The ac-dc transfer differences of thermal transfer standards were intercompared using the comparator system with a resolution better than 1 ppm. The absolute ad-dc transfer differences of single-junction thermal converters (SJTC's) were evaluated in terms of a multijunction thermal converter and by the modified fast-reversed dc method. The results obtained by the two methods agreed within 1 ppm.
引用
收藏
页码:603 / 607
页数:5
相关论文
共 9 条
[1]   MULTIJUNCTION THERMAL CONVERTERS AS THE NBS PRIMARY AC DC TRANSFER STANDARDS FOR AC CURRENT AND VOLTAGE MEASUREMENTS [J].
HERMACH, FL ;
KINARD, JR ;
HASTINGS, JR .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (02) :300-306
[2]   CURRENT-INDEPENDENT AC-DC TRANSFER ERRORS IN SINGLE-JUNCTION THERMAL CONVERTERS [J].
INGLIS, BD ;
FRANCHIMON, CC .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1985, 34 (02) :294-301
[3]   AC-DC THERMAL CONVERTERS OF ETL [J].
IWAMOTO, S ;
HIRAYAMA, H .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1974, IM23 (04) :326-329
[5]  
Klonz M., 1990, CPEM '90 Digest. Conference on Precision Electromagnetic Measurements (Cat. No.90CH2822-5), P68, DOI 10.1109/CPEM.1990.109926
[6]  
KLONZ M, 1992, CPEM 92, P54
[7]   A COMPUTERIZED MODEL OF VACUUM THERMOCOUPLE PERFORMANCE [J].
LEVINSON, H .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1991, 40 (02) :356-359
[8]  
TAKAHASHI K, 1992, CPEM 92 C, P72
[9]   A PROPOSAL FOR A MULTIJUNCTION THERMAL CONVERTER [J].
YONEZAKI, G ;
SHIDA, K ;
YAMAZAKI, T .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) :338-341