STATISTICAL DESCRIPTORS IN CRYSTALLOGRAPHY REPORT OF THE INTERNATIONAL UNION OF CRYSTALLOGRAPHY SUBCOMMITTEE ON STATISTICAL DESCRIPTORS

被引：90

作者：

SCHWARZENBACH, D

ABRAHAMS, SC

FLACK, HD

GONSCHOREK, W

HAHN, T

HUML, K

MARSH, RE

PRINCE, E

ROBERTSON, BE

ROLLETT, JS

WILSON, AJC

机构：

[1] AT&T BELL LABS, MURRAY HILL, NJ 07974 USA

[2] UNIV GENEVA, CRISTALLOG RAYONS LAB X, CH-1211 GENEVA 4, SWITZERLAND

[3] FORSCHUNGSZENTRUM JULICH, ZFR, TH DARMSTADT, INST PHYS CHEM, D-5170 JULICH 1, GERMANY

[4] RHEIN WESTFAL TH AACHEN, INST KRISTALLOG, D-5100 AACHEN, GERMANY

[5] CZECHOSLOVAK ACAD SCI, INST MACROMOLEC CHEM, CS-16206 PRAGUE 6, CZECHOSLOVAKIA

[6] CALTECH, DEPT CHEM, PASADENA, CA 91125 USA

[7] NBS, DIV REACTOR RADIAT, GAITHERSBURG, MD 20899 USA

[8] UNIV REGINA, DEPT PHYS & ASTRON, REGINA S4S 0A2, SASKATCHEWAN, CANADA

[9] OXFORD UNIV, COMP LAB, OXFORD OX1 3QD, ENGLAND

[10] UNIV CAMBRIDGE, CHEM LAB, CAMBRIDGE CB2 1EW, ENGLAND

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 1989年 / 45卷

关键词：

D O I：

10.1107/S0108767388009596

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：63 / 75

页数：13

共 77 条

[1] INDICATORS OF ACCURACY IN STRUCTURE FACTOR MEASUREMENT
ABRAHAMA.SC
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 165 - &
[2] NORMAL PROBABILITY PLOT ANALYSIS OF ERROR IN MEASURED AND DERIVED QUANTITIES AND STANDARD DEVIATIONS
ABRAHAMS, SC
KEVE, ET
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAR1) : 157 - &
[3] RELIABILITY OF CRYSTALLOGRAPHIC STRUCTURAL INFORMATION
ABRAHAMS, SC
[J]. ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1974, 30 (FEB15): : 261 - 268
[4] Bayes T., 1763, AMFR S PHILOS T R SO, V53, P370
[5] LEAST-SQUARES ABSOLUTE-STRUCTURE REFINEMENT - PRACTICAL EXPERIENCE AND ANCILLARY CALCULATIONS
BERNARDINELLI, G
FLACK, HD
[J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1985, 41 (SEP): : 500 - 511
[6] FURTHER DEVELOPMENTS IN A LIKELIHOOD RATIO METHOD FOR PRECISE AND ACCURATE DETERMINATION OF LATTICE PARAMETERS
BEU, KE
WHITNEY, DR
[J]. ACTA CRYSTALLOGRAPHICA, 1967, 22 : 932 - &
[7] LIKELIHOOD RATIO METHOD FOR PRECISE AND ACCURATE DETERMINATION OF LATTICE PARAMETERS FOR TETRAGONAL AND HEXAGONAL CRYSTALS
BEU, KE
MUSIL, FJ
WHITNEY, DR
[J]. ACTA CRYSTALLOGRAPHICA, 1963, 16 (12): : 1241 - &
[8] PRECISE AND ACCURATE LATTICE PARAMETERS BY FILM POWDER METHODS .1. LIKELIHOOD RATIO METHOD
BEU, KE
MUSIL, FJ
WHITNEY, DR
[J]. ACTA CRYSTALLOGRAPHICA, 1962, 15 (DEC): : 1292 - &
[9] Blessing R.H., 1987, CRYSTALLOGR REV, V1, P3
[10] Box GE, 2011, BAYESIAN INFERENCE S

← 1 2 3 4 5 6 7 8 →