EXPERIMENTAL-EVIDENCE FOR QUANTUM-SIZE-EFFECT FINE-STRUCTURES IN THE RESISTIVITY OF ULTRATHIN PB AND PB-IN FILMS

被引：102

作者：

JALOCHOWSKI, M ^{[1
]}

BAUER, E ^{[1
]}

KNOPPE, H ^{[1
]}

LILIENKAMP, G ^{[1
]}

机构：

[1] TECH UNIV CLAUSTHAL,INST PHYS,W-3392 CLAUSTHAL ZELLERFE,GERMANY

来源：

PHYSICAL REVIEW B | 1992年 / 45卷 / 23期

关键词：

D O I：

10.1103/PhysRevB.45.13607

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The resistivity of ultrathin single-crystalline Pb and Pb-In layers with thicknesses d smaller than the bulk mean free path 1, is measured during deposition onto Si(111)-(6X6)Au surfaces at about 110 K. The structure of the layers is monitored by reflection high-energy electron diffraction (RHEED). Oscillations of the RHEED specular beam intensity are highly correlated with fine structures of the resistivity. The quantum-size-effect theory is used for a quantitative analysis of the data. The fine structure, volume impurities, small-scale roughness, and large-scale thickness fluctuations are taken into account. The impact of the layer-by-layer growth mode of ultrathin metal films on the thickness dependence of the resistivity is discussed.

引用

页码：13607 / 13613

页数：7

共 30 条

[11]

HARRIS JJ, 1981, SURF SCI, V108, pL444, DOI 10.1016/0039-6028(81)90440-4

[12] EVIDENCE FOR QUANTUM SIZE EFFECTS OBSERVED BY HELIUM ATOM SCATTERING DURING THE GROWTH OF PB ON CU(111) [J].

HINCH, BJ ;

KOZIOL, C ;

TOENNIES, JP ;

ZHANG, G .

EUROPHYSICS LETTERS, 1989, 10 (04) :341-346

[13] SINGLE AND DOUBLE-LAYER GROWTH MECHANISMS INDUCED BY QUANTUM SIZE EFFECTS IN PB FILMS DEPOSITED ON CU(111) [J].

HINCH, BJ ;

KOZIOL, C ;

TOENNIES, JP ;

ZHANG, G .

VACUUM, 1991, 42 (04) :309-311

[14]

HOFFMAN H, 1982, FESTKORPERPROBLEME, P255

[15]

Horn M., 1988, REFLECTION HIGH ENER, P463

[16] EXPERIMENTAL STUDY OF QUANTUM SIZE EFFECTS IN THIN METAL-FILMS BY ELECTRON TUNNELING [J].

JAKLEVIC, RC ;

LAMBE, J .

PHYSICAL REVIEW B, 1975, 12 (10) :4146-4160

[17] RESISTANCE OSCILLATIONS AND CROSSOVER IN ULTRATHIN GOLD-FILMS [J].

JALOCHOWSKI, M ;

BAUER, E .

PHYSICAL REVIEW B, 1988, 37 (15) :8622-8626

[18] QUANTUM SIZE AND SURFACE EFFECTS IN THE ELECTRICAL-RESISTIVITY AND HIGH-ENERGY ELECTRON REFLECTIVITY OF ULTRATHIN LEAD FILMS [J].

JALOCHOWSKI, M ;

BAUER, E .

PHYSICAL REVIEW B, 1988, 38 (08) :5272-5280

[19] REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING THE GROWTH OF PB ON SI(111) [J].

JALOCHOWSKI, M ;

BAUER, E .

JOURNAL OF APPLIED PHYSICS, 1988, 63 (09) :4501-4504

[20] INTENSITY OSCILLATIONS IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION DURING MOLECULAR-BEAM EPITAXY OF NI ON W(110) [J].

KOZIOL, C ;

LILIENKAMP, G ;

BAUER, E .

APPLIED PHYSICS LETTERS, 1987, 51 (12) :901-903

← 1 2 3 →