THE ASYMMETRICALLY CUT BONSE-HART X-RAY DIFFRACTOMETER .2. COMPARISON WITH THE KRATKY CAMERA

被引：5

作者：

DEUTSCH, M

机构：

来源：

关键词：

D O I：

10.1107/S0021889880012022

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：256 / 258

页数：3

共 10 条

[1] TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T)
BONSE, U
HART, M
[J]. APPLIED PHYSICS LETTERS, 1965, 7 (09) : 238 - &
[2] SMALL ANGLE X-RAY SCATTERING BY SPHERICAL PARTICLES OF POLYSTYRENE AND POLYVINYLTOLUENE
BONSE, U
HART, M
[J]. ZEITSCHRIFT FUR PHYSIK, 1966, 189 (02): : 151 - &
[3] BONSE U, 1966, SMALL ANGLE XRAY SCA
[4] THE ASYMMETRICALLY CUT BONSE-HART X-RAY DIFFRACTOMETER .1. DESIGN PRINCIPLES AND PERFORMANCE
DEUTSCH, M
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1980, 13 (JUN) : 252 - 255
[5] KRATKY O, 1970, MAKROMOLEKUL CHEM, V133, P181
[6] KRATKY O, 1964, MAKROMOLEKUL CHEM, V75, P69
[7] KRATKY O, 1958, Z ELEKTROCHEM, V62, P66
[8] KRATKY O, 1954, Z ELEKTROCHEM, V58, P49
[9] KRATKY O, 1958, Z ELEKTROCHEM, V62, P73
[10] STABINGER H, 1979, MAKROMOL CHEM, V180, P2995