FABRICATION OF BURIED GAALAS NM-STRUCTURES BY DEEP UV HOLOGRAPHIC LITHOGRAPHY AND MBE GROWTH ON FINELY CHANNELED SUBSTRATES

被引:13
作者
MARTI, U
PROCTOR, M
MARTIN, D
MORIERGENOUD, F
SENIOR, B
REINHART, FK
机构
[1] Institut de Micro- et d'Optoélectronique, Ecole Polytechnique Fédérale
[2] Institut de Microscopie Electronique Ecole Polytechnique Fédérale
关键词
D O I
10.1016/0167-9317(91)90118-W
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper describes a fabrication procedure for buried GaAlAs structures with lateral feature sizes in the nm range and with a high package density (periodicity LAMBDA = 135nm). GaAs substrates are finely structured by means of deep UV (lambda = 257nm) holographic lithography. We greatly improved this method by the application of a negative image reversal Novolak resist and an antireflective coating. Buried GaAs filaments are fabricated by growing GaAlAs/GaAs/GaAlAs quantum well (QW) structures on nonplanar substrates by molecular beam epitaxy (MBE). A crescent profile of the GaAs wires is obtained for [011] orientation of the grating lines. This is very attractive for the growth of quantum filaments (QF). Low temperature photoluminescence measurements reveal a high quality of QF grown by MBE over finely grooved substrates. The photoluminescence yielded by QF is comparable to that of QW grown on planar substrates.
引用
收藏
页码:391 / 394
页数:4
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