RESOLUTION OF INTERELEMENT SPECTRAL OVERLAPS BY HIGH-RESOLUTION INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY

被引：16

作者：

MORITA, M ^{[1
]}

ITO, H ^{[1
]}

LINSCHEID, M ^{[1
]}

OTSUKA, K ^{[1
]}

机构：

[1] JOEL LTD JAPAN,AKISHIMA,TOKYO 196,JAPAN

来源：

ANALYTICAL CHEMISTRY | 1994年 / 66卷 / 09期

关键词：

D O I：

10.1021/ac00081a038

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The design instrumentation and performance of a high-resolution ICP mass spectrometer in resolving interelement spectral overlaps is reported. A high resolution of 43 000 was obtained by using a double-focusing magnetic sector mass analyzer coupled with an ICP ionization source through a three-stage differential evacuation system and a Q-lens. Resolution of isobar overlaps is demonstrated for Se-76/Ge-76 and Sm-150/Nd-150 at a 1 ppm concentration level.

引用

页码：1588 / 1590

页数：3

共 6 条

[1] INDUCTIVELY COUPLED PLASMA AS AN ION-SOURCE FOR HIGH-RESOLUTION MASS-SPECTROMETRY
BRADSHAW, N
HALL, EFH
SANDERSON, NE
[J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1989, 4 (08) : 801 - 803
[2] DATE AR, 1988, APPLICATION INDUCTIV
[3] INDUCTIVELY COUPLED PLASMA MASS-SPECTROMETRY
HOUK, RS
THOMPSON, JJ
[J]. MASS SPECTROMETRY REVIEWS, 1988, 7 (04) : 425 - 461
[4] HIGH-RESOLUTION MASS-SPECTROMETRY WITH INDUCTIVELY COUPLED ARGON PLASMA IONIZATION SOURCE
MORITA, M
ITO, H
UEHIRO, T
OTSUKA, K
[J]. ANALYTICAL SCIENCES, 1989, 5 (05) : 609 - 610
[5] VAUGHAN MA, 1986, APPL SPECTROSC, V40, P445
[6] [No title captured]

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