DEPENDENCE OF EXTINCTION DISTANCE ON DEVIATION FROM BRAGG CONDITION IN SILICON

被引：9

作者：

CANN, CD

SHEININ, SS

机构：

来源：

PHYSICA STATUS SOLIDI | 1968年 / 30卷 / 02期

关键词：

D O I：

10.1002/pssb.19680300239

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

收藏

页码：791 / &

相关论文

共 15 条

[1] COVALENT BOND IN SILICON
DAWSON, B
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1967, 298 (1455): : 379 - &
[2] DYNAMICAL THEORY OF ELECTRON DIFFRACTION IN LAUE-CASE .3. FORBIDDEN REFLECTION
FUJIMOTO, F
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1960, 15 (06) : 1022 - 1029
[3] RELATIVISTIC DYNAMICAL THEORY OF ELECTRON DIFFRACTION
FUJIWARA, K
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1961, 16 (11) : 2226 - &
[4] EFFECTS OF SYSTEMATIC REFLECTIONS ON MEASUREMENTS OF EXTINCTION DISTANCE AND ABSORPTION OF HIGH ENERGY ELECTRONS IN CRYSTALS
GORINGE, MJ
HOWIE, A
WHELAN, MJ
[J]. PHILOSOPHICAL MAGAZINE, 1966, 14 (128): : 217 - &
[5] ABSOLUTE MEASUREMENT OF STRUCTURE FACTORS OF SI SINGLE CRYSTAL BY MEANS OF X-RAY PENDELLOSUNG FRINGES
HATTORI, H
KURIYAMA, H
KATAGAWA, T
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1965, 20 (06) : 988 - &
[6] THEORY OF THE FORBIDDEN (222) ELECTRON REFLECTION IN THE DIAMOND STRUCTURE
HEIDENREICH, RD
[J]. PHYSICAL REVIEW, 1950, 77 (02): : 271 - 283
[7] HIRSH PB, 1965, ELECTRON MICROSCOPY, P280
[8] MULTIPLE ELASTIC SCATTERING IN ELECTRON DIFFRACTION BY CRYSTALS
HOERNI, JA
[J]. PHYSICAL REVIEW, 1956, 102 (06): : 1534 - 1542
[9] DIFFRACTION CONTRAST OF ELECTRON MICROSCOPE IMAGES OF CRYSTAL LATTICE DEFECTS .2. DEVELOPMENT OF A DYNAMICAL THEORY
HOWIE, A
WHELAN, MJ
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1961, 263 (1312) : 217 - +
[10] IBERS JA, 1962, J PHYS SOC JPN, V17, P4