CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .8. QUALITATIVE INFLUENCE OF NON-SYSTEMATIC REFLECTIONS ON CRITICAL VOLTAGE

被引：5

作者：

DAVID, M ^{[1
]}

GEVERS, R ^{[1
]}

机构：

[1] RIJKS UNIV CTR,FAC WETENSCHAPPEN,B-2020 ANTWERPEN,BELGIUM

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1977年 / 80卷 / 02期

关键词：

D O I：

10.1002/pssb.2220800209

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：477 / 490

页数：14

共 15 条

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DAVID M, 1975, MICROSCOPIE ELECTRON, P121

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[8] CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .2. THEORETICAL-STUDY NEGLECTING ABSORPTION EFFECTS [J].

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[9] CRITICAL VOLTAGE EFFECT IN TRANSMISSION ELECTRON-MICROSCOPY .1. EIGENVALUE DEGENERACY IN 3-BEAM CASE [J].

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[10] BLOCH WAVE NOTATION IN MANY-BEAM ELECTRON DIFFRACTION THEORY [J].

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