COHERENT ELECTRON MICRODIFFRACTION FROM SMALL METAL PARTICLES

被引:15
作者
PAN, M [1 ]
COWLEY, JM [1 ]
BARRY, JC [1 ]
机构
[1] ARIZONA STATE UNIV,CTR SOLID STATE SCI,TEMPE,AZ 85287
关键词
D O I
10.1016/0304-3991(89)90069-7
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:385 / 394
页数:10
相关论文
共 16 条
[1]  
COWLEY JM, 1981, ULTRAMICROSCOPY, V6, P359, DOI 10.1016/S0304-3991(81)80237-9
[2]   COHERENT INTERFERENCE EFFECTS IN SIEM AND CBED [J].
COWLEY, JM .
ULTRAMICROSCOPY, 1981, 7 (01) :19-26
[3]  
COWLEY JM, DIFFRACTION PHYSICS
[4]  
COWLEY JM, 1981, SCANNING ELECTRON MI, P143
[5]   QUANTITATIVE COMPARISON OF CONVERGENT-BEAM ELECTRON-DIFFRACTION (CBED) PATTERNS [J].
FAN, GY .
ULTRAMICROSCOPY, 1988, 26 (1-2) :71-76
[6]   HREM IMAGE-CONTRAST FROM SUPPORTED SMALL METAL PARTICLES [J].
GAI, PL ;
GORINGE, MJ ;
BARRY, JC .
JOURNAL OF MICROSCOPY-OXFORD, 1986, 142 :9-24
[7]  
GALLEZOT P, 1985, J MICROSC SPECT ELEC, V10, P479
[8]   NEW IMAGING METHODS FOR CATALYST PARTICLES [J].
HOWIE, A ;
MARKS, LD ;
PENNYCOOK, SJ .
ULTRAMICROSCOPY, 1982, 8 (1-2) :163-174
[9]   NEW THEORETICAL AND PRACTICAL APPROACH TO MULTISLICE METHOD [J].
ISHIZUKA, K ;
UYEDA, N .
ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (SEP1) :740-749
[10]  
Monosmith W. B., 1983, Ultramicroscopy, V12, P51, DOI 10.1016/0304-3991(83)90304-2