AUTOMATED TEST SET FOR HIGH-RESOLUTION ANALOG-TO-DIGITAL AND DIGITAL-TO-ANALOG CONVERTERS

被引：11

作者：

SOUDERS, TM

FLACH, DR

机构：

[1] Electrosystems Division, National Bureau of Standards, Washington

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1979年 / 28卷 / 04期

关键词：

D O I：

10.1109/TIM.1979.4314824

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An automated test set is described for characterizing the static performance of high resolution ADC's and DAC's. Measured parameters include gain, offset linearity, and equivalent ADC input noise with uncertainties of 2–4 ppm. Measurements to full accuracy can be made at a rate up to 40/s. A 20-bit DAC serves as a comparison standard. Copyright © 1979 by The Institute of Electrical and Electronics Engineers, Inc.

引用

页码：239 / 249

页数：11