EXTREME RADIATION TOLERANCE OF HIGH-TEMPERATURE SOLID-STATE MICROELECTRONICS

被引:3
作者
PALMER, DW
DRAPER, BL
CARLSON, GA
机构
来源
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1981年 / 4卷 / 04期
关键词
D O I
10.1109/TCHMT.1981.1135835
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:466 / 471
页数:6
相关论文
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JOHNSON DR, 1977 P EL COMP C, P524
[2]   EXTREME TEMPERATURE-RANGE MICROELECTRONICS [J].
PALMER, DW ;
HECKMAN, RC .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1978, 1 (04) :333-340
[3]  
WHITE KR, 1978, SAND781037
[4]   RADIATION EFFECTS IN GAAS JUNCTION FIELD-EFFECT TRANSISTORS [J].
ZULEEG, R ;
LEHOVEC, K .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (05) :1343-1354