DETERMINATION OF YBACUO THIN-LAYER STRUCTURAL PARAMETERS BY USING HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY

被引：11

作者：

ARGUNOVA, TS

KYUTT, RN

SCHEGLOV, MP

FALEEV, NN

机构：

[1] Ioffe Physico-Technical Institute, Russian Academy of Sciences, St Petersburg, 194021

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1995年 / 28卷 / 4A期

关键词：

D O I：

10.1088/0022-3727/28/4A/041

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

YBa2Cu3O7-x thin layers grown with a magnetron sputtering technique have been thoroughly investigated by using various x-ray diffractometry schemes. High-resolution triple-crystal setting has proved to be a powerful tool for identifying basic types of damage: out-of-plane grain misorientations, microstrain and grain size. By using double-axis modes, layer thickness and composition were extracted. The lattice parameter c of the layer was measured and discussed in comparison with that of bulk high-temperature superconductor crystals. The results obtained have promoted an essential extension of the range of the YBaCuO layer structural characteristics.

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页码：A212 / A215

页数：4

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