DOPPLER-BROADENED ANNIHILATION LINESHAPE AS AN INDICATOR OF DEFECTS IN METALLIC LATTICES

被引:37
作者
MACKENZIE, IK
机构
[1] University of Guelph, Guelph, Ont.
关键词
D O I
10.1016/0375-9601(69)91169-4
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The annihilation lineshape in a Ge(Li) spectrometer is shown to be sensitive to the presence of metallic defects introduced by plastic deformation or temperature. The effect is attributed to a decrease in the fraction of annihilations with core electrons. © 1969.
引用
收藏
页码:115 / +
页数:1
相关论文
共 6 条